M. Etherton

Characterization and modeling of transient device behavior under CDM ESD stress

Joost Willemen, A. Andreini, V. De Heyn et al. · Journal of Electrostatics · 2004 · 30 citations

Electrical Engineering, Cdm Esd Stress, Engineering +6

Study of CDM specific effects for a smart power input protection structure

M. Etherton, Ningsong Qu, Joost Willemen et al. · Microelectronics Reliability · 2005 · 14 citations

Electrical Engineering, Engineering, Power Ic +6

EDA software for verification of metal interconnects in ESD protection networks at chip, block, and cell level

M. Ershov, Yuri Feinberg, Meruzhan Cadjan et al. · 2013 · 12 citations

Hardware Security, Layout Verification, Electrical Engineering +14

A new full-chip verification methodology to prevent CDM oxide failures

M. Etherton, Scott Ruth, James W. Miller et al. · 2015 · 12 citations

Cdm Oxide Failures, Engineering, Electronic Design Automation +19

Test circuits for fast and reliable assessment of CDM robustness of I/O stages

Wolfgang Stadler, Kai Esmark, K. Reynders et al. · Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) · 2003 · 11 citations

Engineering, Cdm Robustness, Mem Testing +20