K. Reynders

Development of a robust 50V 0.35 μm based Smart Power Technology using trench isolation

F. De Pestel, P. Moens, Hedi Hakim et al. · 2004 · 35 citations

Hardware Security, Low-power Electronics, Electrical Engineering +15

I3T80: a 0.35 μm based system-on-chip technology for 42 V battery automotive applications

P. Moens, D. Bolognesi, L. Delobel et al. · 2003 · 35 citations

Low-power Electronics, Electrical Engineering, Engineering +12

On the electrical SOA of integrated vertical DMOS transistors

P. Moens, K. Reynders · IEEE Electron Device Letters · 2005 · 13 citations

Electrical Soa, Electrical Engineering, Semiconductor Device +10

Dynamics of Integrated Vertical DMOS Transistors Under 100-ns TLP Stress

P. Moens, S. Bychikhin, K. Reynders et al. · IEEE Transactions on Electron Devices · 2005 · 12 citations

Electrical Engineering, Semiconductor Device, Engineering +13

Test circuits for fast and reliable assessment of CDM robustness of I/O stages

Wolfgang Stadler, Kai Esmark, K. Reynders et al. · Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) · 2003 · 11 citations

Engineering, Cdm Robustness, Mem Testing +20