J. Price

Dielectric properties of reservoir rocks at ultra-high frequencies

Liang Shen, W. C. Savre, J. Price et al. · Geophysics · 1985 · 114 citations

Engineering, Earth Sciences, Geology +17

Spectroscopic ellipsometry characterization of HfxSiyOz films using the Cody–Lorentz parameterized model

J. Price, P. Y. Hung, Todd Rhoad et al. · Applied Physics Letters · 2004 · 87 citations

Natural Sciences, Materials Science, Physics +17

Identification of sub-band-gap absorption features at the HfO2∕Si(100) interface via spectroscopic ellipsometry

J. Price, Patrick Lysaght, S. C. Song et al. · Applied Physics Letters · 2007 · 36 citations

Engineering, Materials Engineering, Materials Science +17

Identification of interfacial defects in high-k gate stack films by spectroscopic ellipsometry

J. Price, G. Bersuker, Patrick Lysaght · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2009 · 29 citations

Natural Sciences, Materials Science, Physics +17

Hard x-ray photoelectron spectroscopy study of As and Ga out-diffusion in In_0.53Ga_0.47As/Al₂O₃ film systems

Conan Weiland, P. Lysaght, J. Price et al. · Applied Physics Letters · 2012 · 25 citations

Natural Sciences, Materials Engineering, Materials Science +13