Concepedia
Statistics
Publications
7
Citations
153
H-Index
Active since
2001
Affiliations
IMEC(Current)
Philips (Belgium)
NXP (Belgium)
Philips (Netherlands)
P. Meunier-Beillard is an author at IMEC specializing in engineering, semiconductor devices, and materials science.
Publications per year
2001–2009
N2 as carrier gas: an alternative to H2 for enhanced epitaxy of Si, SiGe and SiGe:C
P. Meunier-Beillard, Matty Caymax, Kris Van Nieuwenhuysen et al. · Applied Surface Science · 2003 · 36 citations
Engineering, Materials Engineering, Materials Science +14
Selective epitaxial deposition of strained silicon: a simple and effective method for fabricating high performance MOSFET devices
Romain Delhougne, Geert Eneman, Matty Caymax et al. · Solid-State Electronics · 2004 · 31 citations
Engineering, Electrical Engineering, Materials Science +17
Quantitative prediction of junction leakage in bulk-technology CMOS devices
Ray Duffy, A. Heringa, V. C. Venezia et al. · Solid-State Electronics · 2009 · 24 citations
Engineering, Computer Engineering, Electrical Engineering +16
Structural and optical properties of Ge islands grown in an industrial chemical vapor deposition reactor
Roger Loo, P. Meunier-Beillard, Danielle Vanhaeren et al. · Journal of Applied Physics · 2001 · 22 citations · Full text
Engineering, Materials Engineering, Materials Science +17
A Novel Fully Self-Aligned SiGe:C HBT Architecture Featuring a Single-Step Epitaxial Collector-Base Process
J.J.T.M. Donkers, T. Vanhoucke, F. Vleugels et al. · 2007 · 16 citations
Engineering, Electrical Engineering, Microelectronics +11
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