William G. Bennett

Effectiveness of SEL Hardening Strategies and the Latchup Domino Effect

Nathaniel A. Dodds, Nicholas C. Hooten, Robert A. Reed et al. · IEEE Transactions on Nuclear Science · 2012 · 52 citations

Hardware Security, Electrical Engineering, Sel Hardening Strategies +11

Single- and Multiple-Event Induced Upsets in <formula formulatype="inline"><tex Notation="TeX">${\rm HfO}_2/{\rm Hf}$</tex></formula> 1T1R RRAM

William G. Bennett, Nicholas C. Hooten, Ronald D. Schrimpf et al. · IEEE Transactions on Nuclear Science · 2014 · 42 citations

Hardware Security, \Rm Hf, Electrical Engineering +14

Charge Collection Mechanisms in AlGaN/GaN MOS High Electron Mobility Transistors

Isaak K. Samsel, En Xia Zhang, Nicholas C. Hooten et al. · IEEE Transactions on Nuclear Science · 2013 · 31 citations

Device Modeling, Wide-bandgap Semiconductor, Electrical Engineering +12

TID and Displacement Damage Resilience of 1T1R <formula formulatype="inline"><tex Notation="TeX">${\rm HfO}_2/{\rm Hf}$</tex></formula> Resistive Memories

Stephanie L. Weeden-Wright, William G. Bennett, Nicholas C. Hooten et al. · IEEE Transactions on Nuclear Science · 2014 · 31 citations

\Rm Hf, Engineering, Mechanical Engineering +17

Single-Event Transient Response of InGaAs MOSFETs

Kai Ni, En Xia Zhang, Nicholas C. Hooten et al. · IEEE Transactions on Nuclear Science · 2014 · 26 citations

Electrical Engineering, Engineering, Physics +12