Gert J. Leusink

Comparison of methods to determine bandgaps of ultrathin HfO2 films using spectroscopic ellipsometry

Ming Di, Eric Bersch, Alain C. Diebold et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2011 · 52 citations

Natural Sciences, Materials Engineering, Materials Science +17

The Impacts of Ferroelectric and Interfacial Layer Thicknesses on Ferroelectric FET Design

Nujhat Tasneem, Muhammad Mainul Islam, Zheng Wang et al. · IEEE Electron Device Letters · 2021 · 34 citations

Engineering, Electrical Engineering, Materials Science +17

Trap Capture and Emission Dynamics in Ferroelectric Field-Effect Transistors and their Impact on Device Operation and Reliability

Nujhat Tasneem, Zheng Wang, Zijian Zhao et al. · 2021 IEEE International Electron Devices Meeting (IEDM) · 2021 · 29 citations

Engineering, Electrical Engineering, Materials Science +17

Multi-technique x-ray and optical characterization of crystalline phase, texture, and electronic structure of atomic layer deposited Hf1−xZrxO2 gate dielectrics deposited by a cyclical deposition and annealing scheme

Relja Vasić, Steven Consiglio, Robert D. Clark et al. · Journal of Applied Physics · 2013 · 26 citations

Natural Sciences, Materials Engineering, Materials Science +17

Comparison of B2O3 and BN deposited by atomic layer deposition for forming ultrashallow dopant regions by solid state diffusion

Steven Consiglio, Robert D. Clark, David O’Meara et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2015 · 24 citations

Natural Sciences, Materials Engineering, Materials Science +17