Concepedia

Eric Bersch

EB

Statistics

Publications

10

Citations

601

H-Index

10

Active since

2008

Affiliations

University at Albany, State University of New York(Current)

Rutgers, The State University of New Jersey

Brookhaven National Laboratory

In-Q-Tel

Eric Bersch is an author at University at Albany, State University of New York specializing in materials science, natural sciences, and semiconductor materials.

Publications per year

2008–2013

10

Publications

10

Band offsets of ultrathin high-<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>κ</mml:mi></mml:math>oxide films with Si

Eric Bersch, Sylvie Rangan, R. A. Bartynski et al. · Physical Review B · 2008 · 268 citations

, , +14

Complete band offset characterization of the HfO2/SiO2/Si stack using charge corrected x-ray photoelectron spectroscopy

Eric Bersch, Ming Di, Steven Consiglio et al. · Journal of Applied Physics · 2010 · 132 citations

, , +17

Comparison of methods to determine bandgaps of ultrathin HfO2 films using spectroscopic ellipsometry

Ming Di, Eric Bersch, Alain C. Diebold et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2011 · 52 citations

, , +17

Optical metrology of Ni and NiSi thin films used in the self-aligned silicidation process

Vimal Kamineni, M. Raymond, Eric Bersch et al. · Journal of Applied Physics · 2010 · 36 citations

, , +17

Multi-technique x-ray and optical characterization of crystalline phase, texture, and electronic structure of atomic layer deposited Hf1−xZrxO2 gate dielectrics deposited by a cyclical deposition and annealing scheme

Relja Vasić, Steven Consiglio, Robert D. Clark et al. · Journal of Applied Physics · 2013 · 26 citations

, , +17

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