Hugo W. Chan

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Active since

1986

Affiliations

Advanced Micro Devices (United States)(Current)

Hugo W. Chan is an author at Advanced Micro Devices (United States) specializing in hot-carrier degradation, semiconductor reliability, and microelectronics.

Publications per year

1986–1987

Publications

Structure and Frequency Dependence of Hot-Carrier-Induced Degradation in CMOS VLSI

C.C. Yao, J.J. Tzou, R. Cheung et al. · 1987 · 12 citations

Engineering, Electrical Engineering, Microelectronics +16

Temperature Dependence of CMOS Device Reliability

C.C. Yao, Joseph Thou, R. Cheung et al. · 1986 · 12 citations

Engineering, Electrical Engineering, Electronic Materials +16

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