Yongwoo Jeon

Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors by Using Multifrequency Capacitance–Voltage Characteristics

Sangwon Lee, Sungwook Park, Sung‐Chul Kim et al. · IEEE Electron Device Letters · 2010 · 159 citations

Materials Science, Device Modeling, Electrical Engineering +13

Modeling and characterization of metal-semiconductor-metal-based source-drain contacts in amorphous InGaZnO thin film transistors

Sangwon Lee, Jun‐Hyun Park, Kichan Jeon et al. · Applied Physics Letters · 2010 · 55 citations

Materials Science, Device Modeling, Electrical Engineering +14

Real-Time TCAD: a new paradigm for TCAD in the artificial intelligence era

Sanghoon Myung, Jinwoo Kim, Yongwoo Jeon et al. · 2020 · 26 citations

Artificial Intelligence, Engineering, Machine Learning +22

High performance amorphous oxide thin film transistors with self-aligned top-gate structure

Jae Chul Park, Sang Wook Kim, Sun Il Kim et al. · 2009 · 25 citations

Materials Science, Electrical Engineering, Channel Engineering +14

Relation Between Low-Frequency Noise and Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors

Sung‐Chul Kim, Yongwoo Jeon, Je‐Hun Lee et al. · IEEE Electron Device Letters · 2010 · 24 citations

Semiconductor Technology, Electrical Engineering, Engineering +11