Kichan Jeon

Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors by Using Multifrequency Capacitance–Voltage Characteristics

Sangwon Lee, Sungwook Park, Sung‐Chul Kim et al. · IEEE Electron Device Letters · 2010 · 159 citations

Materials Science, Device Modeling, Electrical Engineering +13

Modeling of amorphous InGaZnO thin-film transistors based on the density of states extracted from the optical response of capacitance-voltage characteristics

Kichan Jeon, Changjung Kim, Ihun Song et al. · Applied Physics Letters · 2008 · 110 citations

Device Modeling, Deep States, Electrical Engineering +12

Extraction of Density of States in Amorphous GaInZnO Thin-Film Transistors by Combining an Optical Charge Pumping and Capacitance–Voltage Characteristics

Jun‐Hyun Park, Kichan Jeon, Sangwon Lee et al. · IEEE Electron Device Letters · 2008 · 57 citations

Optical Materials, Engineering, I Xmlns +21

Modeling and characterization of metal-semiconductor-metal-based source-drain contacts in amorphous InGaZnO thin film transistors

Sangwon Lee, Jun‐Hyun Park, Kichan Jeon et al. · Applied Physics Letters · 2010 · 55 citations

Materials Science, Device Modeling, Electrical Engineering +14

Electrical stress-induced instability of amorphous indium-gallium-zinc oxide thin-film transistors under bipolar ac stress

Sang‐Won Lee, Kichan Jeon, Jun‐Hyun Park et al. · Applied Physics Letters · 2009 · 42 citations

Materials Science, Bipolar Ac Stress, Electrical Engineering +15