Yuan-Shih Chen

Diagnosis with Limited Failure Information

Yu Huang, Wu-Tung Cheng, N. Tamarapalli et al. · Proceedings/Proceedings - International Test Conference · 2006 · 38 citations

Engineering, Computer Engineering, Systems Engineering +11

Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns

Yu Huang, Wu-Tung Cheng, Ruifeng Guo et al. · 2009 · 34 citations

Engineering, Computer Engineering, Manufacturing Engineering +15

Yield Learning with Layout-aware Advanced Scan Diagnosis

Jayanth Mekkoth, M. Siva Rama Krishna, Jun Qian et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2006 · 28 citations

Engineering, Computer Engineering, Electrical Engineering +12

Diagnose compound scan chain and system logic defects

Yu Huang, Will Hsu, Yuan-Shih Chen et al. · 2007 · 25 citations

Computing, Computer Engineering, Diagnostic Assessment +13

Layout-Aware Diagnosis Leads to Efficient and Effective Physical Failure Analysis

Manish Sharma, Sergej Schwarz, Juergen Schmerberg et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2011 · 13 citations

Engineering, Computer Engineering, Design Automation +11