T. Zabel

Physical and electrical characterization of Hafnium oxide and Hafnium silicate sputtered films

Agnese Callegari, E. Cartier, M. Gribelyuk et al. · Journal of Applied Physics · 2001 · 265 citations

Natural Sciences, Materials Engineering, Materials Science +17

Microstructure and thermal stability of HfO2 gate dielectric deposited on Ge(100)

E. P. Gusev, Huiling Shang, M. Copel et al. · Applied Physics Letters · 2004 · 96 citations

Engineering, Materials Engineering, Materials Science +17

Trace element analysis using proton-induced X-ray emission spectroscopy

V. Valković, R.B. Liebert, T. Zabel et al. · Nuclear Instruments and Methods · 1974 · 60 citations

Natural Sciences, Chemistry, Elemental Analysis +9

Variation in Trace Metal Concentrations along Single Hairs as Measured by Proton-induced X-ray Emission Photometry

V. Valković, R. M. Wheeler, R.B. Liebert et al. · Nature · 1973 · 36 citations

Natural Sciences, Chemistry, Toxicology +15

X-Ray Production by Protons of 2.5-12-MeV Energy

R.B. Liebert, T. Zabel, Harold Theodore Larson et al. · Physical review. A, General physics · 1973 · 31 citations

Natural Sciences, Physics, Nuclear Physics +8