T. Hirao

Single-event current transients induced by high energy ion microbeams

I. Nashiyama, T. Hirao, Tomihiro Kamiya et al. · IEEE Transactions on Nuclear Science · 1993 · 82 citations

Electrical Engineering, Single-event Current Transients, Single-event Upset +14

Development of a new data collection system and chamber for microbeam and laser investigations of single event phenomena

Jamie S. Laird, T. Hirao, Hidenobu Mori et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2001 · 65 citations

Photonics, Single Event Phenomena, Engineering +9

Temperature dependence of heavy ion-induced current transients in Si epilayer devices

Jamie S. Laird, T. Hirao, Shinobu Onoda et al. · IEEE Transactions on Nuclear Science · 2002 · 49 citations

Semiconductor Technology, Electrical Engineering, Si Epilayer Devices +14

Analysis of single-ion multiple-bit upset in high-density DRAMs

A. Makihara, H. Shindou, Norio Nemoto et al. · IEEE Transactions on Nuclear Science · 2000 · 48 citations

Electrical Engineering, Engineering, Physics +10

Temperature dependence of single-event transient current induced by heavy-ion microbeam on p/sup +//n/n/sup +/ epilayer junctions

Gang Guo, T. Hirao, Jamie S. Laird et al. · IEEE Transactions on Nuclear Science · 2004 · 44 citations

Electrical Engineering, Ion Implantation, Engineering +11