Jayhoon Chung

Statistics

Publications

Citations

200

H-Index

Active since

2005

Affiliations

Texas Instruments (United States)(Current)

The University of Texas at Austin

Jayhoon Chung is an author at Texas Instruments (United States) specializing in materials science, transmission electron microscopy, and electron microscopy.

Publications per year

2005–2012

Publications

Practical and Reproducible Mapping of Strains in Si Devices Using Geometric Phase Analysis of Annular Dark-Field Images From Scanning Transmission Electron Microscopy

Jayhoon Chung, Guoda Lian, Lew Rabenberg · IEEE Electron Device Letters · 2010 · 50 citations

Engineering, Materials Engineering, Materials Science +17

Effects of strain gradients on strain measurements using geometrical phase analysis in the transmission electron microscope

Jayhoon Chung, Lew Rabenberg · Ultramicroscopy · 2008 · 39 citations

Natural Sciences, Materials Engineering, Materials Science +15

The origin of broad distribution of breakdown times in polycrystalline thin film dielectrics

Muhammad Masuduzzaman, Sujing Xie, Jayhoon Chung et al. · Applied Physics Letters · 2012 · 24 citations

Natural Sciences, Materials Engineering, Materials Science +17

Layout Variation Effects in Advanced MOSFETs: STI-Induced Embedded SiGe Strain Relaxation and Dual-Stress-Liner Boundary Proximity Effect

Youn Sung Choi, Guoda Lian, C. B. Vartuli et al. · IEEE Transactions on Electron Devices · 2010 · 23 citations

Engineering, Electrical Engineering, Mechanical Behavior Of Materials +16

Measurement of incomplete strain relaxation in a silicon heteroepitaxial film by geometrical phase analysis in the transmission electron microscope

Jayhoon Chung, Lew Rabenberg · Applied Physics Letters · 2007 · 21 citations

Engineering, Materials Engineering, Materials Science +17

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