J.P. McVittie

Ultra-high-yield growth of vertical single-walled carbon nanotubes: Hidden roles of hydrogen and oxygen

Guangyu Zhang, David J. Mann, Li Zhang et al. · Proceedings of the National Academy of Sciences · 2005 · 430 citations · Full text

Two-dimensional thermal oxidation of silicon. II. Modeling stress effects in wet oxides

Dah-Bin Kao, J.P. McVittie, William D. Nix et al. · IEEE Transactions on Electron Devices · 1988 · 376 citations

Stress Effects, Engineering, Oxidation Resistance +24

Technology and reliability constrained future copper interconnects. I. Resistance modeling

Pawan Kapur, J.P. McVittie, Krishna C. Saraswat · IEEE Transactions on Electron Devices · 2002 · 245 citations

Engineering, Interconnect (Integrated Circuits), Reliability Engineering +19

Two-dimensional thermal oxidation of silicon—I. Experiments

Dah-Bin Kao, J.P. McVittie, William D. Nix et al. · IEEE Transactions on Electron Devices · 1987 · 205 citations

Notching as an example of charging in uniform high density plasmas

Takashi Kinoshita, M. Hane, J.P. McVittie · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 165 citations

Engineering, Plasma Science, High Density Plasma +16