X. Li

Physical mechanisms of endurance degradation in TMO-RRAM

B. Chen, Yang Lu, Bin Gao et al. · 2011 · 166 citations

Engineering, Materials Engineering, Materials Science +13

Twin gate, vertical slit FET (VeSFET) for highly periodic layout and 3D integration

W. Maly, Navab Singh, Zhenghua Chen et al. · International Conference Mixed Design of Integrated Circuits and Systems · 2011 · 62 citations

Engineering, Computer Engineering, Electrical Engineering +17

Highly compact 1T-1R architecture (4F<sup>2</sup> footprint) involving fully CMOS compatible vertical GAA nano-pillar transistors and oxide-based RRAM cells exhibiting excellent NVM properties and ultra-low power operation

X. P. Wang, X. Li, Bin Chen et al. · 2012 · 59 citations

Engineering, Computer Engineering, Electrical Engineering +16

Vertical Silicon Nanowire Platform for Low Power Electronics and Clean Energy Applications

D. L. Kwong, X. Li, Yi Sun et al. · Journal of Nanotechnology · 2011 · 49 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Low-Frequency Noise in Oxide-Based $(\hbox{TiN}/ \hbox{HfO}_{x}/\hbox{Pt})$ Resistive Random Access Memory Cells

Hongya Yu, J. A. Chroboczek, G. Ghibaudo et al. · IEEE Transactions on Electron Devices · 2012 · 33 citations

Engineering, Electrical Engineering, Materials Science +17