C.A. Billman

Electrical characteristics of epitaxially grown SrTiO₃ on silicon for metal-insulator-semiconductor gate dielectric applications

Sanghun Jeon, F. J. Walker, C.A. Billman et al. · IEEE Electron Device Letters · 2003 · 32 citations

Materials Science, Electrical Characteristics, Electrical Engineering +13

Alternate Gate Oxides for Silicon Mosfets Using High-<i>k</i> Dielectrics

C.A. Billman, P.H. Tan, K. J. Hubbard et al. · MRS Proceedings · 1999 · 24 citations

Electrical Engineering, Engineering, Microelectronics +2

Development of MBE II–VI Epilayers on GaAs(211)B

R. N. Jacobs, C. Nozaki, L. A. Almeida et al. · Journal of Electronic Materials · 2012 · 21 citations

Semiconductors, Mbe Ii–vi Epilayers, Ii-vi Semiconductor +4

Ferroelectric stability of BaTiO₃ in a crystalline oxide on semiconductor structure

J. W. Reiner, F. J. Walker, R. A. McKee et al. · physica status solidi (b) · 2004 · 16 citations

Critical Thickness, Engineering, Batio 3 +16

Design for ASIC Reliability for Low-Temperature Applications

Y. Chen, Lynett Westergard, Mohammad Mojarradi et al. · IEEE Transactions on Device and Materials Reliability · 2006 · 15 citations

Engineering, Reliability Engineering, Asic Implementation +19