Niu Jin

Processing dependent behavior of soft imprint lithography on the 1-10-nm scale

Hua Feng, Anshu Gaur, Yugang Sun et al. · IEEE Transactions on Nanotechnology · 2006 · 58 citations

Dependent Behavior, Engineering, Electron-beam Lithography +26

Diffusion barrier cladding in Si/SiGe resonant interband tunneling diodes and their patterned growth on PMOS source/drain regions

Niu Jin, Sung-Yong Chung, Anthony T. Rice et al. · IEEE Transactions on Electron Devices · 2003 · 47 citations

Materials Science, Room Temperature, Electrical Engineering +14

151  kA/cm 2 peak current densities in Si/SiGe resonant interband tunneling diodes for high-power mixed-signal applications

Niu Jin, Sung-Yong Chung, Anthony T. Rice et al. · Applied Physics Letters · 2003 · 45 citations

Semiconductor Technology, Electrical Engineering, Highest Pvcr +12

A photon detector with very high gain at low bias and at room temperature

Ömer Gökalp Memiş, Alex Katsnelson, Soon‐Cheol Kong et al. · Applied Physics Letters · 2007 · 39 citations

Low Bias, Photonics, Electrical Engineering +15

Sub-Poissonian shot noise of a high internal gain injection photon detector

Ömer Gökalp Memiş, Alex Katsnelson, Soon‐Cheol Kong et al. · Optics Express · 2008 · 35 citations · Full text

Photonic Device, Photonics, High Internal Gain +11