Jun He

Initiation and arrest of an interfacial crack in a four-point bend test

Zhenyu Huang, Zhigang Suo, Guanghai Xu et al. · Engineering Fracture Mechanics · 2005 · 64 citations

Interfacial Crack, Engineering, Four-point Bend Test +8

Reliability characterization of 32nm high-K and Metal-Gate logic transistor technology

Sangwoo Pae, Ashwin Ashok, T. Ghani et al. · 2010 · 59 citations

Reliability, Electrical Engineering, Reliability Engineering +10

Electromigration lifetime and critical void volume

Jun He, Zhigang Suo, T. Marieb et al. · Applied Physics Letters · 2004 · 38 citations

Engineering, Transport Phenomena, Statistical Distribution +16

Direct measurement and analysis of the time-dependent evolution of stress in silicon devices and solder interconnections in power assemblies

Jun He, M.C. Shaw, John C. Mather et al. · 2002 · 30 citations

Engineering, Mechanical Engineering, Advanced Packaging (Semiconductors) +18

A 4 kb Metal-Fuse OTP-ROM Macro Featuring a 2 V Programmable 1.37 $\mu$m$^{2}$<i>1T1R</i> Bit Cell in 32 nm High-k Metal-Gate CMOS

S. Kulkarni, Zhanping Chen, Jun He et al. · IEEE Journal of Solid-State Circuits · 2010 · 28 citations

Engineering, Vlsi Design, Emerging Memory Technology +17