Andreas Schulze

Three-Dimensional Observation of the Conductive Filament in Nanoscaled Resistive Memory Devices

Umberto Celano, Ludovic Goux, Attilio Belmonte et al. · Nano Letters · 2014 · 332 citations

Observed Filament, Such Filament, Engineering +19

Vertically stacked gate-all-around Si nanowire transistors: Key Process Optimizations and Ring Oscillator Demonstration

Hans Mertens, R. Ritzenthaler, V. Peña et al. · 2017 · 124 citations

Electrical Engineering, Si Nanowire, Vlsi Design +14

First Demonstration of Vertically Stacked Gate-All-Around Highly Strained Germanium Nanowire pFETs

E. Capogreco, Liesbeth Witters, Hiroaki Arimura et al. · IEEE Transactions on Electron Devices · 2018 · 59 citations

Semiconductor Technology, Electrical Engineering, Engineering +13

Strained Germanium Gate-All-Around pMOS Device Demonstration Using Selective Wire Release Etch Prior to Replacement Metal Gate Deposition

Liesbeth Witters, Hiroaki Arimura, Farid Sebaai et al. · IEEE Transactions on Electron Devices · 2017 · 53 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +12

In-situ observation of non-hemispherical tip shape formation during laser-assisted atom probe tomography

Sebastian Koelling, Nicolas Innocenti, Andreas Schulze et al. · Journal of Applied Physics · 2011 · 49 citations

Engineering, Sem Imaging, Microscopy +19