Shuting Shi

Deep Transfer Bug Localization

Xuan Huo, Ferdian Thung, Ming Li et al. · IEEE Transactions on Software Engineering · 2019 · 82 citations

Engineering, Machine Learning, Feature Learning +10

A Quatro-Based 65-nm Flip-Flop Circuit for Soft-Error Resilience

Y.-Q. Li, Haibin Wang, Rui Liu et al. · IEEE Transactions on Nuclear Science · 2017 · 59 citations

Hardware Security, Low-power Electronics, Electrical Engineering +11

Automatic Code Review by Learning the Revision of Source Code

Shuting Shi, Ming Li, David Lo et al. · Proceedings of the AAAI Conference on Artificial Intelligence · 2019 · 45 citations · Full text

Software Maintenance, Engineering, Software Systems +20

Microbeam Heavy-Ion Single-Event Effect on Xilinx 28-nm System on Chip

Weitao Yang, Xuecheng Du, Chaohui He et al. · IEEE Transactions on Nuclear Science · 2017 · 23 citations

Heavy-ion Microbeam Experiment, Electrical Engineering, Sensitive Block +14

Characterization of Single-Event Transient Pulse Broadening Effect in 65 nm Bulk Inverter Chains Using Heavy Ion Microbeam

Yaqing Chi, Ruiqiang Song, Shuting Shi et al. · IEEE Transactions on Nuclear Science · 2016 · 19 citations

Electrical Engineering, Engineering, High Voltage Engineering +9