Shuting Shi

Deep Transfer Bug Localization

Xuan Huo, Ferdian Thung, Ming Li et al. · IEEE Transactions on Software Engineering · 2019 · 83 citations

Computing, Data Science, Feature Engineering +13

A Quatro-Based 65-nm Flip-Flop Circuit for Soft-Error Resilience

Y.-Q. Li, Haibin Wang, Rui Liu et al. · IEEE Transactions on Nuclear Science · 2017 · 60 citations

Engineering, Computer Engineering, Electrical Engineering +15

Automatic Code Review by Learning the Revision of Source Code

Shuting Shi, Ming Li, David Lo et al. · Proceedings of the AAAI Conference on Artificial Intelligence · 2019 · 46 citations · Full text

Computing, Computer Science, Machine Learning +11

Microbeam Heavy-Ion Single-Event Effect on Xilinx 28-nm System on Chip

Weitao Yang, Xuecheng Du, Chaohui He et al. · IEEE Transactions on Nuclear Science · 2017 · 23 citations

Engineering, Computer Engineering, Electrical Engineering +17

Characterization of Single-Event Transient Pulse Broadening Effect in 65 nm Bulk Inverter Chains Using Heavy Ion Microbeam

Yaqing Chi, Ruiqiang Song, Shuting Shi et al. · IEEE Transactions on Nuclear Science · 2016 · 19 citations

Engineering, Electrical Engineering, Microelectronics +13