Yaqing Chi

Novel Layout Technique for N-Hit Single-Event Transient Mitigation via Source-Extension

Jianjun Chen, Shuming Chen, Yibai He et al. · IEEE Transactions on Nuclear Science · 2012 · 52 citations

Hardware Security, Low-power Electronics, Electrical Engineering +12

Heavy-Ion-Induced Charge Sharing Measurement With a Novel Uniform Vertical Inverter Chains (UniVIC) SEMT Test Structure

Pengcheng Huang, Shuming Chen, Jianjun Chen et al. · IEEE Transactions on Nuclear Science · 2015 · 38 citations

Electrical Engineering, Engineering, Hardware Reliability +12

Impact of Circuit Placement on Single Event Transients in 65 nm Bulk CMOS Technology

Yibai He, Shuming Chen, Jianjun Chen et al. · IEEE Transactions on Nuclear Science · 2012 · 37 citations

Horizontal Placement Design, Electrical Engineering, Single Event Transients +15

Characterization of Single-Event Transient Pulse Broadening Effect in 65 nm Bulk Inverter Chains Using Heavy Ion Microbeam

Yaqing Chi, Ruiqiang Song, Shuting Shi et al. · IEEE Transactions on Nuclear Science · 2016 · 19 citations

Electrical Engineering, Engineering, High Voltage Engineering +9

PABAM: A Physics-Based Analytical Model to Estimate Bipolar Amplification Effect Induced Collected Charge at Circuit Level

Ruiqiang Song, Shuming Chen, Yankang Du et al. · IEEE Transactions on Device and Materials Reliability · 2015 · 18 citations

Engineering, Power Electronics, Charge Transport +16