Pengcheng Huang

Novel Layout Technique for Single-Event Transient Mitigation Using Dummy Transistor

Jianjun Chen, Shuming Chen, Yibai He et al. · IEEE Transactions on Device and Materials Reliability · 2012 · 62 citations

Heavy-Ion-Induced Charge Sharing Measurement With a Novel Uniform Vertical Inverter Chains (UniVIC) SEMT Test Structure

Pengcheng Huang, Shuming Chen, Jianjun Chen et al. · IEEE Transactions on Nuclear Science · 2015 · 38 citations

Electrical Engineering, Engineering, Hardware Reliability +12

Impact of Circuit Placement on Single Event Transients in 65 nm Bulk CMOS Technology

Yibai He, Shuming Chen, Jianjun Chen et al. · IEEE Transactions on Nuclear Science · 2012 · 37 citations

Horizontal Placement Design, Electrical Engineering, Single Event Transients +15

Recoil-Ion-Induced Single Event Upsets in Nanometer CMOS SRAM Under Low-Energy Proton Radiation

Zhenyu Wu, Shuming Chen, Junting Yu et al. · IEEE Transactions on Nuclear Science · 2016 · 26 citations

Nanometer Cmos Sram, Electrical Engineering, Engineering +15

Effect of ultrasonic rolling on surface integrity, machining accuracy, and tribological performance of bearing steels under different process schemes

Pengcheng Huang, Yanshuang Wang, Jianghai Lin et al. · CIRP journal of manufacturing science and technology · 2023 · 25 citations

Engineering, Different Process Schemes, Material Machining +6