Weitao Yang

Mechanical Condition Recognition of Medium-Voltage Vacuum Circuit Breaker Based on Mechanism Dynamic Features Simulation and ANN

Mingzhe Rong, Xiaohua Wang, Weitao Yang et al. · IEEE Transactions on Power Delivery · 2005 · 37 citations

Fault Diagnosis, Electrical Engineering, Reliability Engineering +14

1700 V High-Performance GaN HEMTs on 6-inch Sapphire With 1.5 μm Thin Buffer

Xiangdong Li, Junbo Wang, Jincheng Zhang et al. · IEEE Electron Device Letters · 2023 · 33 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +9

Atmospheric neutron single event effect test on Xilinx 28 nm system on chip at CSNS-BL09

Weitao Yang, Yonghong Li · Microelectronics Reliability · 2019 · 24 citations

Nm System, Engineering, Radiation Detection +10

Microbeam Heavy-Ion Single-Event Effect on Xilinx 28-nm System on Chip

Weitao Yang, Xuecheng Du, Chaohui He et al. · IEEE Transactions on Nuclear Science · 2017 · 23 citations

Heavy-ion Microbeam Experiment, Electrical Engineering, Sensitive Block +14

p-GaN Gate HEMTs on 6-Inch Sapphire by CMOS-Compatible Process: A Promising Game Changer for Power Electronics

Zhanfei Han, Xiangdong Li, Jian Ji et al. · IEEE Electron Device Letters · 2024 · 22 citations · Full text