Toshio Nakanishi

Nondestructive discrimination of small glass fragments for forensic examination using high energy synchrotron radiation x‐ray fluorescence spectrometry

Yoshinori Nishiwaki, Toshio Nakanishi, Yasuko Terada et al. · X-Ray Spectrometry · 2006 · 25 citations

Natural Sciences, Materials Science, Spectroscopy +13

Forensic Discrimination of Sheet Glass by a Refractive-Index Measurement and Elemental Analysis with Synchrotron Radiation X-ray Fluorescence Spectrometry

Yasuhiro Suzuki, Masaaki Kasamatsu, Shinichi Suzuki et al. · Analytical Sciences · 2005 · 24 citations

Natural Sciences, Chemistry, Materials Science +17

Characterization of Strain for High-Performance Metal–Oxide–Semiconductor Field-Effect-Transistor

Daisuke Kosemura, Yasuto Kakemura, T. Yoshida et al. · Japanese Journal of Applied Physics · 2008 · 24 citations

Engineering, Materials Engineering, Materials Science +17

Lower limits of detection of synchrotron radiation high-energy X-ray fluorescence spectrometry and its possibility for the forensic application for discrimination of glass fragments

Toshio Nakanishi, Yoshinori Nishiwaki, Naoki Miyamoto et al. · Forensic Science International · 2007 · 22 citations

Natural Sciences, Chemistry, Radiology +14

Application of Total Reflection X-ray Fluorescence Spectrometry to Small Glass Fragments

Yoshinori Nishiwaki, Masahiko Shimoyama, Toshio Nakanishi et al. · Analytical Sciences · 2006 · 22 citations

Natural Sciences, Chemistry, Materials Science +13