Daisuke Kosemura

UV-Raman Spectroscopy System for Local and Global Strain Measurements in Si

Atsushi Ogura, Kosuke Yamasaki, Daisuke Kosemura et al. · Japanese Journal of Applied Physics · 2006 · 93 citations

Materials Science, Strain Mapping, Engineering +13

Transverse-optical phonons excited in Si using a high-numerical-aperture lens

Daisuke Kosemura, Atsushi Ogura · Applied Physics Letters · 2010 · 34 citations

Materials Science, Photonics, Engineering +13

Strain-induced transconductance enhancement by pattern dependent oxidation in silicon nanowire field-effect transistors

Aya Seike, Tomoyuki Tange, Yasushi Sugiura et al. · Applied Physics Letters · 2007 · 32 citations

Materials Science, Device Modeling, Electrical Engineering +15

Channel strain analysis in high-performance damascene-gate p-metal-oxide-semiconductor field effect transistors using high-spatial resolution Raman spectroscopy

Munehisa Takei, Daisuke Kosemura, Kohki Nagata et al. · Journal of Applied Physics · 2010 · 30 citations

Semiconductor Technology, Electrical Engineering, Channel Strain Analysis +10

Characterization of Strain for High-Performance Metal–Oxide–Semiconductor Field-Effect-Transistor

Daisuke Kosemura, Yasuto Kakemura, T. Yoshida et al. · Japanese Journal of Applied Physics · 2008 · 24 citations

Materials Science, Semiconductor Technology, Electrical Engineering +10