Yasuto Kakemura

Characterization of Strain for High-Performance Metal–Oxide–Semiconductor Field-Effect-Transistor

Daisuke Kosemura, Yasuto Kakemura, T. Yoshida et al. · Japanese Journal of Applied Physics · 2008 · 24 citations

Materials Science, Semiconductor Technology, Electrical Engineering +10

Measurement of in-plane and depth strain profiles in strained-Si substrates

Atsushi Ogura, Daisuke Kosemura, Kosuke Yamasaki et al. · Solid-State Electronics · 2007 · 17 citations

Depth Strain Profiles, Engineering, Physics +9

Evaluation of super-critical thickness strained-Si on insulator (sc-SSOI) substrate

Atsushi Ogura, T. Yoshida, Daisuke Kosemura et al. · Solid-State Electronics · 2008 · 13 citations

Electrical Engineering, Engineering, Applied Physics +4

Evaluation and Control of Strain in Si Induced by Patterned SiN Stressor

Atsushi Ogura, Hiroyuki Saitoh, Daisuke Kosemura et al. · Electrochemical and Solid-State Letters · 2009 · 10 citations

Engineering, Mechanical Engineering, Sin Inner Stress +21