Evaluation of super-critical thickness strained-Si on insulator (sc-SSOI) substrate - Concepedia

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Evaluation of super-critical thickness strained-Si on insulator (sc-SSOI) substrate

13

Citations

17

References

2008

Year

Atsushi Ogura, T. Yoshida, Daisuke Kosemura, Yasuto Kakemura, Masahiro Takei, haruyuki saito, Takayoshi Shimura, Tomoyuki Koganesawa, Ichiro Hirosawa

Solid-State Electronics

Electrical EngineeringEngineeringApplied PhysicsSemiconductor MaterialSemiconductor Device FabricationSuper-critical Thickness Strained-siSilicon On Insulator

References

	Year	Citations

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