Kohki Nagata

Channel strain analysis in high-performance damascene-gate p-metal-oxide-semiconductor field effect transistors using high-spatial resolution Raman spectroscopy

Munehisa Takei, Daisuke Kosemura, Kohki Nagata et al. · Journal of Applied Physics · 2010 · 30 citations

Semiconductor Technology, Electrical Engineering, Channel Strain Analysis +10

Detection of SO2 at the ppm Level with Localized Surface Plasmon Resonance (LSPR) Sensing

Yuki Takimoto, Akira Monkawa, Kohki Nagata et al. · Plasmonics · 2019 · 19 citations

Plasmonics, Chemical Engineering, Engineering +9

Localized surface plasmon resonance sensing of SO2 and H2S using zeolitic imidazolate framework-8

Yuki Takimoto, Akira Monkawa, Kohki Nagata et al. · Sensors and Actuators B Chemical · 2023 · 18 citations

Materials Science, Plasmonics, Engineering +6

Evaluation of Strained-Silicon by Electron Backscattering Pattern Measurement: Comparison Study with UV-Raman Measurement and Edge Force Model Calculation

Motohiro Tomita, Daisuke Kosemura, Munehisa Takei et al. · Japanese Journal of Applied Physics · 2011 · 16 citations

Engineering, Silicon On Insulator, Uv-raman Measurement +21

Study of Strain Induction for Metal–Oxide–Semiconductor Field-Effect Transistors using Transparent Dummy Gates and Stress Liners

Daisuke Kosemura, Munehisa Takei, Kohki Nagata et al. · Japanese Journal of Applied Physics · 2009 · 15 citations

Materials Science, Semiconductor Technology, Electrical Engineering +14