Chune-Sin Yeh

Impact ionization rate of electrons for accurate simulation of substrate current in submicron devices

Samar K. Saha, Chune-Sin Yeh, B. Gadepally · Solid-State Electronics · 1993 · 29 citations

Engineering, Electrical Engineering, Physics +16

GLACIER: a hot carrier gate level circuit characterization and simulation system for VLSI design

Lifeng Wu, Jingkun Fang, Hirokazu Yonezawa et al. · 2002 · 24 citations

Engineering, Computer Engineering, Electrical Engineering +17

Consideration of age degradation in the RF performance of CMOS radio chips for high volume manufacturing

Mark N. Ruberto, Tzvi Maimon, Y. Shemesh et al. · 2005 · 13 citations

Engineering, Computer Engineering, Electrical Engineering +17

Ratio based hot-carrier degradation modeling for aged timing simulation of millions of transistors digital circuits

Hirokazu Yonezawa, Jingjun Fang, Yoshiyuki Kawakami et al. · 2002 · 13 citations

Engineering, Computer Engineering, Electrical Engineering +17

Investigation and Modeling of Hot Carrier Effects on Performance of 45- and 55-nm NMOSFETs With RF Automatic Measurement

Mao-Chyuan Tang, Yean-Kuen Fang, Wen‐Shiang Liao et al. · IEEE Transactions on Electron Devices · 2008 · 12 citations

Engineering, Electrical Engineering, Microelectronics +16