Hai Jiang

The Impact of Self-Heating on HCI Reliability in High-Performance Digital Circuits

Hai Jiang, SangHoon Shin, Xiaoyan Liu et al. · IEEE Electron Device Letters · 2017 · 52 citations

Engineering, Vlsi Design, Computer Architecture +24

Investigation of Self-Heating Effect on Hot Carrier Degradation in Multiple-Fin SOI FinFETs

Hai Jiang, Xiaoyan Liu, Nuo Xu et al. · IEEE Electron Device Letters · 2015 · 46 citations

Electrical Engineering, Semiconductor Device, Engineering +13

Integrated modeling of Self-heating of confined geometry (FinFET, NWFET, and NSHFET) transistors and its implications for the reliability of sub-20 nm modern integrated circuits

Woojin Ahn, SangHoon Shin, Chang‐Ming Jiang et al. · Microelectronics Reliability · 2018 · 44 citations

Device Modeling, Electrical Engineering, Semiconductor Device +10

Characterization of self-heating leads to universal scaling of HCI degradation of multi-fin SOI FinFETs

Hai Jiang, SangHoon Shin, Xiaoyan Liu et al. · 2016 · 41 citations

Engineering, Integrated Circuits, Universal Scaling +19

Reliability on Evolutionary FinFET CMOS Technology and Beyond

Kihyun Choi, Hyun Chul Sagong, Minjung Jin et al. · 2020 · 21 citations

Engineering, Vlsi Design, Finfet Technology +16