Room-Temperature Triggered Single Photon Emission from a III-Nitride Site-Controlled Nanowire Quantum Dot

Mark Holmes, Kihyun Choi, Satoshi Kako, +2

Nano Letters

Quantum SciencePhotonicsQuantum PhotonicsRoom TemperatureEngineering +11

Selective-area growth of thin GaN nanowires by MOCVD

Kihyun Choi, Munetaka Arita, Yasuhiko Arakawa

Journal of Crystal Growth

EngineeringNanotechnologyApplied PhysicsGan Power DeviceThin Gan Nanowires +1

A 10nm platform technology for low power and high performance application featuring FINFET devices with multi workfunction gate stack on bulk and SOI

Kwangyou Seo, Bala Haran, Divya Gupta, +81

EngineeringVlsi DesignFinfet TechnologyIntegrated CircuitsWafer Scale Processing +16

Single Photons from a Hot Solid-State Emitter at 350 K

Mark Holmes, Satoshi Kako, Kihyun Choi, +2

ACS Photonics

Categoryquantum ElectronicsQuantum PhotonicsEngineeringCavity QedOptoelectronic Devices +23

Spectral diffusion and its influence on the emission linewidths of site-controlled GaN nanowire quantum dots

Mark Holmes, Satoshi Kako, Kihyun Choi, +2

Physical Review B

Electrical EngineeringPhotoluminescenceEngineeringPhysicsNanotechnology +13

Photoluminescence from highly excited AlN epitaxial layers

Yoichi Yamada, Kihyun Choi, Seung‐Ho Shin, +4

Applied Physics Letters

Aluminium NitrideElectronic Excited StateOptical MaterialsEngineeringPhotoluminescence +11

Strong exciton confinement in site-controlled GaN quantum dots embedded in nanowires

Kihyun Choi, Satoshi Kako, Mark Holmes, +2

Applied Physics Letters

EngineeringOscillator StrengthOptoelectronic DevicesSite-controlled QdsStrong Exciton Confinement +18

Site-controlled growth of single GaN quantum dots in nanowires by MOCVD

Kihyun Choi, Munetaka Arita, Satoshi Kako, +1

Journal of Crystal Growth

EngineeringPhysicsNanotechnologyApplied PhysicsGan Power Device +4

Reliability on Evolutionary FinFET CMOS Technology and Beyond

Kihyun Choi, Hyun Chul Sagong, Minjung Jin, +11

EngineeringVlsi DesignFinfet TechnologyScaled FinfetReliability Engineering +14

Enhanced Reliability of 7-nm Process Technology Featuring EUV

Kihyun Choi, Hyewon Shim, Junekyun Park, +11

IEEE Transactions on Electron Devices

EngineeringComputer ArchitectureScaled FinfetEnhanced ReliabilityReliability Engineering +14