Katsumi Watanabe

Concepts for chemical state analysis at constant probing depth by lab‐based XPS/HAXPES combining soft and hard X‐ray sources

Sebastian Siol, Jennifer E. Mann, John Newman et al. · Surface and Interface Analysis · 2020 · 52 citations · Full text

Precipitation Sequence in the Mg–Gd–Y System Investigated by HRTEM and HAADF-STEM

Yuuki Matsuoka, Kenji Matsuda, Katsumi Watanabe et al. · MATERIALS TRANSACTIONS · 2014 · 28 citations · Full text

The electronic band structure analysis of OLED device by means of in situ LEIPS and UPS combined with GCIB

Masahiro Terashima, Takuya Miyayama, Tetsuro Shirao et al. · Surface and Interface Analysis · 2020 · 27 citations

Materials Science, Electrical Engineering, Electronic Devices +15

Analysis of buried interfaces in multilayer device structures with hard XPS (HAXPES) using a CrKα source

O. Renault, E. Martínez, C. Zborowski et al. · Surface and Interface Analysis · 2018 · 25 citations

Secondary ion yields for vacuum‐type electrospray droplet beams measured with a triple focus time‐of‐flight analyzer

Satoshi Ninomiya, Yuji Sakai, Ryo Watanabe et al. · Rapid Communications in Mass Spectrometry · 2016 · 16 citations