Ulvac-Phi (Japan)

Alteration of Ti 2p XPS spectrum for titanium oxide by low‐energy Ar ion bombardment

Satoshi Hashimoto, Akihiro Tanaka · Surface and Interface Analysis · 2002 · 218 citations

Engineering, Tio 2, Titanium Oxide +16

Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Alexander G. Shard, Rasmus Havelund, M. P. Seah et al. · Analytical Chemistry · 2012 · 140 citations

Removal of Ar ⁺ beam‐induced damaged layers from polyimide surfaces with argon gas cluster ion beams

Takuya Miyayama, N. Sanada, Scott R. Bryan et al. · Surface and Interface Analysis · 2010 · 112 citations

Extremely low sputtering degradation of polytetrafluoroethylene by C ₆₀ ion beam applied in XPS analysis

N. Sanada, A. Yamamoto, Retsu OIWA et al. · Surface and Interface Analysis · 2004 · 96 citations

The stratum corneum comprises three layers with distinct metal-ion barrier properties

Akiharu Kubo, Itsuko Ishizaki, Akiko Kubo et al. · Scientific Reports · 2013 · 89 citations · Full text