Yoshiaki Toyota

A New Model for Device Degradation in Low-Temperature N-Channel Polycrystalline Silicon TFTs Under AC Stress

Yoshiaki Toyota, T. Shiba, M. Ohkura · IEEE Transactions on Electron Devices · 2004 · 38 citations

Electrical Engineering, Engineering, New Model +15

Effects of the Timing of AC Stress on Device Degradation Produced by Trap States in Low-Temperature Polycrystalline-Silicon TFTs

Yoshiaki Toyota, T. Shiba, M. Ohkura · IEEE Transactions on Electron Devices · 2005 · 33 citations

Engineering, Silicon On Insulator, Semiconductor Device +18

Novel 3.3-kV advanced trench HiGT with low loss and low dv/dt noise

Yoshiaki Toyota, So Watanabe, Taiga Arai et al. · 2013 · 26 citations

Trench Higt, Semiconductor Technology, Electrical Engineering +10

A New Study on the Degradation Mechanism in Low-Temperature p-Channel Polycrystalline Silicon TFTs Under Dynamic Stress

Yoshiaki Toyota, M. Matsumura, Mutsuko Hatano et al. · IEEE Transactions on Electron Devices · 2006 · 15 citations

Electrical Engineering, Engineering, Pulse Stress +14