Alessandro Maconi

Comprehensive investigation of the impact of lateral charge migration on retention performance of planar and 3D SONOS devices

Alessandro Maconi, A. Arreghini, Christian Monzio Compagnoni et al. · Solid-State Electronics · 2012 · 53 citations

Electrical Engineering, Semiconductor Device, Engineering +9

Semi-Analytical Model for the Transient Operation of Gate-All-Around Charge-Trap Memories

Salvatore Amoroso, Christian Monzio Compagnoni, Aurelio Giancarlo Mauri et al. · IEEE Transactions on Electron Devices · 2011 · 44 citations · Full text

Device Modeling, Semiconductors, Electrical Engineering +14

Physical Modeling for Programming of TANOS Memories in the Fowler–Nordheim Regime

Christian Monzio Compagnoni, Aurelio Giancarlo Mauri, Salvatore Amoroso et al. · IEEE Transactions on Electron Devices · 2009 · 31 citations · Full text

Comprehensive Investigation of Statistical Effects in Nitride Memories—Part I: Physics-Based Modeling

Aurelio Giancarlo Mauri, Christian Monzio Compagnoni, Salvatore Amoroso et al. · IEEE Transactions on Electron Devices · 2010 · 26 citations · Full text

Engineering, Comprehensive Investigation, Charge Transport +17

Impact of lateral charge migration on the retention performance of planar and 3D SONOS devices

Alessandro Maconi, A. Arreghini, Christian Monzio Compagnoni et al. · 2011 · 23 citations

Engineering, Emerging Memory Technology, Planar Sonos Devices +17