Comprehensive investigation of the impact of lateral charge migration on retention performance of planar and 3D SONOS devices - Concepedia

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Comprehensive investigation of the impact of lateral charge migration on retention performance of planar and 3D SONOS devices

53

Citations

20

References

2012

Year

Alessandro Maconi, A. Arreghini, Christian Monzio Compagnoni, G. Van den bosch, Alessandro S. Spinelli, Jan Van Houdt, Andrea L. Lacaita

Solid-State Electronics

Electrical EngineeringSemiconductor DeviceEngineeringAdvanced Packaging (Semiconductors)NanoelectronicsBias Temperature InstabilitySonos DevicesElectronic PackagingMicroelectronicsLateral Charge MigrationRetention PerformanceElectrical Insulation

References

	Year	Citations

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