Statistics
Publications
3
Citations
95
H-Index
3
Active since
1985
Affiliations
IBM (United States)(Current)
Wayne S. Berry is an author at IBM (United States) specializing in engineering, materials science, and electronic materials.
Publications per year
1985–2004
3
3
Reliability and design qualification of a sub-micron tungsten silicide E-Fuse
W. Tonti, J.A. Fifield, J. F. Higgins et al. · 2004 · 16 citations
Engineering, Computer Engineering, Electrical Engineering +16
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