J. Penaud

Electrical Properties of III-V/Oxide Interfaces

Guy Brammertz, H. C. Lin, Koen Martens et al. · ECS Transactions · 2009 · 76 citations

Wide-bandgap Semiconductor, Electrical Engineering, Interface State Distribution +15

Effective reduction of interfacial traps in Al2O3/GaAs (001) gate stacks using surface engineering and thermal annealing

Yen‐Chung Chang, Clément Merckling, J. Penaud et al. · Applied Physics Letters · 2010 · 72 citations · Full text

Engineering, Important Gaas, Semiconductor Device +18

Capacitance–Voltage Characterization of GaAs–Oxide Interfaces

Guy Brammertz, H. C. Lin, Koen Martens et al. · Journal of The Electrochemical Society · 2008 · 56 citations

High FET Performance for a Future CMOS $\hbox{GeO}_{2}$ -Based Technology

Florence Bellenger, Brice De Jaeger, Clément Merckling et al. · IEEE Electron Device Letters · 2010 · 51 citations

Radical Oxidation, Engineering, Vlsi Design +20

Molecular beam epitaxy passivation studies of Ge and III–V semiconductors for advanced CMOS

Clément Merckling, J. Penaud, David Kohen et al. · Microelectronic Engineering · 2009 · 17 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +9