J. L. Garrett

Direct measurement of strain effects on magnetic and electrical properties of epitaxial SrRuO3 thin films

Q. Gan, R. A. Rao, Chang‐Beom Eom et al. · Applied Physics Letters · 1998 · 303 citations

Natural Sciences, Materials Science, Physics +17

Direct comparison of silicon and silicon carbide power transistors in high-frequency hard-switched applications

John Glaser, Jeffrey Nasadoski, Peter A. Losee et al. · 2011 · 92 citations

Engineering, Electrical Engineering, Materials Science +17

Bias-stress induced threshold voltage and drain current instability in 4H–SiC DMOSFETs

T. Okayama, S. D. Arthur, J. L. Garrett et al. · Solid-State Electronics · 2007 · 59 citations

Engineering, Electrical Engineering, Materials Science +16

Microwave power SiC MESFETs and GaN HEMTs

A.P. Zhang, L.B. Rowland, E.B. Kaminsky et al. · Solid-State Electronics · 2003 · 49 citations

Engineering, Electrical Engineering, Materials Science +14

Active threshold compensation circuit for improved performance in cooled CMOS systems

J. L. Garrett, Mircea R. Stan · 2002 · 11 citations

Engineering, Computer Engineering, Electrical Engineering +17