Concepedia

T. Okayama

TO

2

Publications

77

Citations

2

H-Index

2007

Active since

Affiliations

George Mason University(Current)

GE Global Research (United States)

T. Okayama is an author at George Mason University specializing in engineering, applied physics, and electrical engineering.

Top concepts

EngineeringApplied PhysicsMicroelectronicsElectrical EngineeringNanoelectronicsPower Electronics

Publications per year

2007–2008

2

Publications

2

Bias-stress induced threshold voltage and drain current instability in 4H–SiC DMOSFETs

T. Okayama, S. D. Arthur, J. L. Garrett et al. · Solid-State Electronics · 2007 · 58 citations

Semiconductor Technology, Electrical Engineering, Engineering +8

Stability and 2-D Simulation Studies of Avalanche Breakdown in 4H-SiC DMOSFETs With JTE

T. Okayama, S. D. Arthur, R. Ramakrishna Rao et al. · IEEE Transactions on Electron Devices · 2008 · 19 citations

Electrical Engineering, Bias Stress, Engineering +13

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