D. S. Golubović

Degradation modeling of mid-power white-light LEDs by using Wiener process

Jianlin Huang, D. S. Golubović, Sau Koh et al. · Optics Express · 2015 · 82 citations · Full text

Reliability, Led Devices, Electrical Engineering +13

Experimental and Simulation Analysis of Program/Retention Transients in Silicon Nitride-Based NVM Cells

Elisa Vianello, F. Driussi, A. Arreghini et al. · IEEE Transactions on Electron Devices · 2009 · 65 citations · Full text

Non-volatile Memory, Engineering, Vlsi Design +23

Degradation Mechanisms of Mid-Power White-Light LEDs Under High-Temperature–Humidity Conditions

Jianlin Huang, D. S. Golubović, Sau Koh et al. · IEEE Transactions on Device and Materials Reliability · 2015 · 62 citations

White Oled, Electrical Engineering, Solid-state Lighting +13

Rapid Degradation of Mid-Power White-Light LEDs in Saturated Moisture Conditions

Jianlin Huang, D. S. Golubović, Sau Koh et al. · IEEE Transactions on Device and Materials Reliability · 2015 · 58 citations

Materials Science, White Oled, Electrical Engineering +14

Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test

Jianlin Huang, D. S. Golubović, Sau Koh et al. · Reliability Engineering & System Safety · 2016 · 55 citations

White Oled, Solid-state Lighting, Engineering +4