T. Yamada

Two-dimensional analysis of surface-state effects on turn-on characteristics in GaAs MESFETs

K. Horio, T. Yamada · IEEE Transactions on Electron Devices · 1999 · 68 citations

Engineering, Electrical Engineering, Materials Science +17

Overview and Future Challenge of Ferroelectric Random Access Memory Technologies

Yoshihisa Kato, Yukihiro Kaneko, Kazuhiro Kaibara et al. · Japanese Journal of Applied Physics · 2007 · 42 citations

Engineering, Electrical Engineering, Materials Science +17

A CMOS 40 MHz 8 b 105 mW two-step ADC

N. Fukushima, T. Yamada, N. Kumazawa et al. · 2003 · 34 citations

Engineering, Computer Engineering, Electrical Engineering +17

0.18-<tex>$muhboxm$</tex>Nondestructive Readout FeRAM Using Charge Compensation Technique

Yasuyuki Kato, T. Yamada, Yasuhiro Shimada · IEEE Transactions on Electron Devices · 2005 · 27 citations

Engineering, Electrical Engineering, Microelectronics +14

Two-dimensional analysis of substrate-trap effects on turn-on characteristics in GaAs MESFETs

K. Horio, A. Wakabayashi, T. Yamada · IEEE Transactions on Electron Devices · 2000 · 23 citations

Engineering, Electrical Engineering, Microelectronics +16