Concepedia

Samuel O’Mullane

SO

Statistics

Publications

4

Citations

108

H-Index

4

Active since

2014

Affiliations

Nanosys (United States)(Current)

SUNY Polytechnic Institute

Samuel O’Mullane is an author at Nanosys (United States) specializing in materials science, materials engineering, and scatterometry.

Publications per year

2014–2016

4

Publications

4

Surface oxidation of the topological insulator Bi2Se3

Avery J. Green, Sonal Dey, Yong Q. An et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2016 · 62 citations

Natural Sciences, Materials Engineering, Materials Science +17

Sensitivity analysis and line edge roughness determination of 28-nm pitch silicon fins using Mueller matrix spectroscopic ellipsometry-based optical critical dimension metrology

Dhairya Dixit, Samuel O’Mullane, Sravan Sunkoju et al. · Journal of Micro/Nanolithography MEMS and MOEMS · 2015 · 23 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Enhancing one dimensional sensitivity with plasmonic coupling

Samuel O’Mullane, Brennan Peterson, Joseph Race et al. · Optics Express · 2014 · 12 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Modeling ellipsometric measurement of three-dimensional structures with rigorous coupled wave analysis and finite element method simulations

Samuel O’Mullane, Nick Keller, Alain C. Diebold · Journal of Micro/Nanolithography MEMS and MOEMS · 2016 · 11 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

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