D. P. Adams - Concepedia

Author

D. P. Adams

Sandia National Laboratories

Also Known As

D Adams, D. Adams, D. P. Adams, D.P Adams, DP Adams

Publications

487

Citations

H-Index

Concepts

All Affiliations

Sandia National Laboratories Sandia National Laboratories California

About

D. P. Adams is an author at Sandia National Laboratories specializing in engineering, materials science, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	7	7	455
2	Applied Physics	5	5	255
3	Chemistry	2	2	83
4	Natural Sciences	1	1	29
5	Computer Engineering	1	1	77

D. P. Adams

Publications

455

Citations

H-Index

Page 1

	Year	Citations
Focused ion beam-shaped microtools for ultra-precision machining of cylindrical components Yoosuf N. Picard, D. P. Adams, M. J. Vasile, Precision Engineering Materials ScienceUltra-precision MachiningEngineeringMicrofabricationTarget Fabrication	2002	123
Microgrooving and microthreading tools for fabricating curvilinear features D. P. Adams, M. J. Vasile, Ashok Krishnan Precision Engineering EngineeringComputer EngineeringGrid ComputingParallel ProgrammingComputer-aided Design	2000	77
Accurate focused ion beam sculpting of silicon using a variable pixel dwell time approach D. P. Adams, M. J. Vasile Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Planar SolidsIon Beam SculptingEngineeringIon ImplantationPhysics	2006	61
Nanometer-scale lithography on Si(001) using adsorbed H as an atomic layer resist D. P. Adams, Thomas Mayer, B. S. Swartzentruber Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Microscope TipEngineeringElectron-beam LithographyNanometer-scale Feature DefinitionSilicon On Insulator	1996	61
Selective area growth of metal nanostructures D. P. Adams, Thomas Mayer, B. S. Swartzentruber Applied Physics Letters Fe Metal LinesEngineeringSurface NanotechnologyMetallic NanomaterialsChemistry	1996	54
Field emission characteristics of the scanning tunneling microscope for nanolithography Thomas Mayer, D. P. Adams, B.M. Marder Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena EngineeringElectron-beam LithographyMicroscopyElectron OpticBeam Diameter	1996	50
Initial Stages of Fe Chemical Vapor Deposition onto Si(100) D. P. Adams, Laura L. Tedder, T. M. Mayer, Physical Review Letters EngineeringChemistryChemical DepositionSilicon On InsulatorTunneling Microscopy	1995	29

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