Marius Nel

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Publications

Citations

148

H-Index

Active since

1986

Affiliations

Port Elizabeth Provincial Hospital(Current)

Stellenbosch University

Marius Nel is an author at Port Elizabeth Provincial Hospital specializing in semiconductor materials, device characterization, and semiconductor characterization.

ORCID

Publications per year

1986–2014

Publications

Detection of minority-carrier defects by deep level transient spectroscopy using Schottky barrier diodes

F.D. Auret, Marius Nel · Journal of Applied Physics · 1987 · 35 citations

Engineering, Electrical Engineering, Materials Science +17

Deep-level transient spectroscopy detection of defects created in epitaxial GaAs after electron-beam metallization

Marius Nel, F.D. Auret · Journal of Applied Physics · 1988 · 23 citations

Natural Sciences, Materials Engineering, Materials Science +16

Deep level transient spectroscopy of hole defects in bulk-grown p-GaAs using Schottky barrier diodes

F.D. Auret, Marius Nel · Applied Physics Letters · 1986 · 20 citations

Engineering, Electrical Engineering, Materials Science +15

Single scan defect identification by deep level transient spectroscopy using a two-phase lock-in amplifier (I Q-DLTS)

F.D. Auret, Marius Nel · Journal of Applied Physics · 1988 · 18 citations

Engineering, Electrical Engineering, Semiconductor Devices +10

Characterization of defects introduced during dc magnetron sputter deposition of Ti–W on n-Si

F.D. Auret, Marius Nel, N. A. Bojarczuk · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1986 · 15 citations

Engineering, Electrical Engineering, Materials Science +16

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