Jon C. Lee

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Active since

2002

Affiliations

Taiwan Semiconductor Manufacturing Company (Taiwan)(Current)

Jon C. Lee is an author at Taiwan Semiconductor Manufacturing Company (Taiwan) specializing in electrical engineering, engineering, and semiconductor devices.

Publications per year

2002–2009

Publications

Fault Localization in Contact Level by Using Conductive Atomic Force Microscopy

Jon C. Lee, J.H. Chuang · Proceedings - International Symposium for Testing and Failure Analysis · 2003 · 20 citations

Engineering, Electrical Engineering, Materials Science +12

Investigation of Sensitivity Improvement on Passive Voltage Contrast for Defect Isolation

Jon C. Lee, C.H. Chen, David Su et al. · Microelectronics Reliability · 2002 · 17 citations

Engineering, Electrical Engineering, Microelectronics +5

A Novel Application of C-AFM: Deep Sub-micron Single Probing for IC Failure Analysis

Jon C. Lee, J.H. Chuang · Microelectronics Reliability · 2003 · 14 citations

Engineering, Computer Engineering, Electrical Engineering +12

Single Device Characterization by Nano-probing to Identify Failure Root Cause

Chao-Chi Wu, Jon C. Lee, Jung-Hsiang Chuang et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2005 · 13 citations

Engineering, Electrical Engineering, Nanomaterials +13

A study of electrical characteristic changes in MOSFET by electron beam irradiation

Yasuhiro Mitsui, Takeshi Sunaoshi, Jon C. Lee · Microelectronics Reliability · 2009 · 12 citations

Engineering, Electrical Engineering, Materials Science +14

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