Takeshi Sunaoshi - Concepedia

Author

Takeshi Sunaoshi

Hitachi (Japan)

Also Known As

Sunaoshi Takeshi, Sunaoshi, Takeshi, T Sunaoshi, T. Sunaoshi, Takeshi Sunaoshi

Publications

243

Citations

H-Index

Concepts

All Affiliations

Hitachi (Japan)Hitachi High-Tech (Japan)Hitachi Global Storage Technologies (United States)

About

Takeshi Sunaoshi is an author at Hitachi (Japan) specializing in engineering, microelectronics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	4	4	71
2	Applied Physics	2	2	43
3	Electrical Engineering	2	2	28
4	Physics	1	1	29
5	Biomedical Imaging	1	1	14

Takeshi Sunaoshi

Publications

200

Citations

H-Index

Page 1

	Year	Citations
Hierarchical Nanoporous Glass with Antireflectivity and Superhydrophilicity by One-Pot Etching Takuya Fujima, Eitaro Futakuchi, Tomohiro Tomita, Langmuir	2014	43
Rapid, High‐Temperature, In Situ Microwave Synthesis of Bulk Nanocatalysts Geng Zhong, Shaomao Xu, Mingjin Cui, Small	2019	41
Lattice imaging at an accelerating voltage of 30kV using an in-lens type cold field-emission scanning electron microscope Mitsuru KONNO, Takeshi Ogashiwa, Takeshi Sunaoshi, Ultramicroscopy EngineeringElectron MicroscopyPhysicsMicroscopyMicroscopy Method	2013	29
STEM/SEM, Chemical Analysis, Atomic Resolution and Surface Imaging At ≤ 30 kV with No Aberration Correction for Nanomaterials on Graphene Support Takeshi Sunaoshi, Kazutoshi Kaji, Yoshihisa Orai, Microscopy and Microanalysis	2016	28
Laboratory evidence for co-condensed oxygen- and carbon-rich meteoritic stardust from nova outbursts Pierre Haenecour, Jane Y. Howe, T. J. Zega, Nature Astronomy Cosmic AbundancePhotometryCarbon-rich Meteoritic StardustAstrochemistryNova Outbursts	2019	17
The First Results of the Low Voltage Cold-FE SEM/STEM System Equipped With EELS Yu Yamazawa, Satoshi Okada, Zulihuma Yasenjiang, Microscopy and Microanalysis Electrical EngineeringEngineeringMicroelectronicsFirst ResultsElectrical Insulation	2016	16
Voltage contrast imaging with energy filtered signal in a field-emission scanning electron microscope Yoichiro Hashimoto, Shuichi Takeuchi, Takeshi Sunaoshi, Ultramicroscopy EngineeringElectron MicroscopyMicroscopyVoltage ContrastMicroscopy Method	2019	14
A study of electrical characteristic changes in MOSFET by electron beam irradiation Yasuhiro Mitsui, Takeshi Sunaoshi, Jon C. Lee Microelectronics Reliability Device ModelingElectrical EngineeringEngineeringNanoelectronicsElectronic Engineering	2009	12

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