Lattice imaging at an accelerating voltage of 30kV using an in-lens type cold field-emission scanning electron microscope - Concepedia

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Lattice imaging at an accelerating voltage of 30kV using an in-lens type cold field-emission scanning electron microscope

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Citations

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References

2013

Year

Mitsuru KONNO, Takeshi Ogashiwa, Takeshi Sunaoshi, Yoshihisa Orai, Mitsugu Sato

Ultramicroscopy

EngineeringElectron MicroscopyPhysicsMicroscopyMicroscopy MethodScanning Probe MicroscopyIn-lens TypeApplied PhysicsElectron MicroscopeInstrumentationSynchrotron RadiationElectron Optic

References

	Year	Citations

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