STEM/SEM, Chemical Analysis, Atomic Resolution and Surface Imaging At ≤ 30 kV with No Aberration Correction for Nanomaterials on Graphene Support

Abstract

Investigations of nano-particles can require a significant number of methods both, EELS and EDX, diffraction, the capability to image at atomic resolution and for differentiating the surface from an STEM image. Such capabilities are available in a single instrument at reasonable cost.